About Yokoyama Yoshisato
About Renesas Electronics Corporation,Tokyo,Japan
About Goto Kenji
About Renesas Electronics Corporation,Tokyo,Japan
About Miura Tomohiro
About Renesas Electronics Corporation,Tokyo,Japan
About Ouchi Yukari
About Renesas Electronics Corporation,Tokyo,Japan
About Nakamura Daisuke
About Renesas Electronics Corporation,Tokyo,Japan
About Ishikawa Jiro
About Renesas Electronics Corporation,Tokyo,Japan
About Nagata Shunya
About Renesas Electronics Corporation,Tokyo,Japan
About Tsujihashi Yoshiki
About Renesas Electronics Corporation,Tokyo,Japan
About Ishii Yuichiro
About Renesas Electronics Corporation,Tokyo,Japan
About IEEE Conference Proceedings
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About failure
About leakage current
About stop time
About bias
About SRAM
About screening(inspection)
About test structure
About 費用対効果
About 供給電圧
About 待機電力
About オーバヘッド
About Speach processing
About Code theory
About Special-purpose arithmetic and control units
About SOC
About MCU
About 待機
About 埋込み
About SRAM
About 費用効果
About テスト
About スクリーニング