Art
J-GLOBAL ID:202002278488128272   Reference number:20A0582290

Study on energy level bending at heterojunction of solution-processed phthalocyanine thin film and n-Si by Kelvin probe force microscopy

Kelvinプローブ力顕微鏡による溶液処理フタロシアニン薄膜とn-Siのヘテロ接合におけるエネルギー準位曲げに関する研究【JST・京大機械翻訳】
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Material:
Volume: 78  Page: Null  Publication year: 2020 
JST Material Number: W1352A  ISSN: 1566-1199  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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Surface potential of a solutio...
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Physical properties of polymer solids  ,  Solid-solid interface 
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