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J-GLOBAL ID：202002282889194749   Reference number：20A1017433

Reciprocal Space Map Measurement of Ceramics Thin Films for Unequal Lattice Change at High Temperature

高温での不均一格子変化のためのセラミック薄膜の逆空間マップ測定【JST・京大機械翻訳】

Author (3)： Saiki Atsushi (University of Toyama, Graduate School of Science and Engineering for Research Toyama Japan Gohuku 3190) ,  Miwa Shogo (University of Toyama, Graduate School of Science and Engineering for Education Toyama Japan) ,  Hashizume Takashi (University of Toyama, Collaboration and Promotion Center for Industry and Academia Toyama Japan)
Material： Materials Science Forum  (Mater Sci Forum)
Volume： 985  Page： 218-222  Publication year： 2020 
JST Material Number： D0716B  ISSN： 0255-5476  Document type： Article
Article type： 原著論文  Country of issue： Switzerland (CHE)  Language： ENGLISH (EN)

Abstract/Point： Ceria and zirconia are very im...

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Thesaurus term： epitaxy ,  *high temperature ,  lattice constant ,  *thin film ,  heater ,  fuel cell ,  covering ,  corrosion resistance ,  zirconium oxide ,  cerium oxide ,  strain rate ,  phase (topology) ,  lower layer ,  warming ,  *reciprocal lattice space

Author keywords (4)： Lattice Distortion ,  Reciprocal Space Maps ,  Thin Film ,  Thermal Coefficients

JST classification (1)： Oxide thin films  (BK14050P)

Terms in the title (4)： 不均一 ,  格子 ,  セラミック薄膜 ,  マップ