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J-GLOBAL ID：202002286999161250   Reference number：20A0830131

Investigation on the Breakdown Strength of Aged Special Layered Silicone Dielectrics under DC Stres

DC Stresの下での劣化した特殊層状シリコーン誘電体の絶縁破壊強度に関する研究【JST・京大機械翻訳】

Author (2)： Aganbegovic Mirnes (Leibniz Universitaet Hannover,Institute of Electric Power Systems (IfES), Division of High Voltage Engineering and Asset Management, Schering-Institute,Hannover,Germany,30167) ,  Werle Peter (Leibniz Universitaet Hannover,Institute of Electric Power Systems (IfES), Division of High Voltage Engineering and Asset Management, Schering-Institute,Hannover,Germany,30167)
Material： IEEE Conference Proceedings  (IEEE Conf Proc)
Volume： 2019  Issue： CEIDP  Page： 706-709  Publication year： 2019 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： In polymeric insulations space...

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Thesaurus term： *polysiloxane ,  direct voltage ,  macromolecule ,  conductive property ,  fracture testing ,  space charge ,  voltage ,  electric field ,  silicon ,  *dielectric strength ,  *dielectrics ,  monolayer ,  field intensity ,  electrical conductivity ,  insulating material

JST classification (5)： Graphic and image processing in general  (JE04010I) ,  Special-purpose arithmetic and control units  (JC04030Y) ,  Pattern recognition  (JE07000S) ,  Speach processing  (JE05000E) ,  Code theory  (ND02030R)

Terms in the title (6)： DC ,  層状 ,  シリコーン ,  誘電体 ,  絶縁破壊強度 ,  研究