In-situ Temperature Measurement Using In-Contact Thin-Film Sensors and Radio Frequency Identification (RFID)

THILAGARANI Dinesh Krishna; MANI Ganesh Kumar; OKIMURA Kunio; TSUCHIYA Kazuyoshi

Art

J-GLOBAL ID：202002288010443902 Reference number：20A2052261

In-situ Temperature Measurement Using In-Contact Thin-Film Sensors and Radio Frequency Identification (RFID)

接触薄膜センサと高周波識別装置(RFID)を使用したその場温度測定

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Volume： 2020 Issue：秋季(CD-ROM) Page： ROMBUNNO.H0206 Publication year： Aug. 20, 2020
JST Material Number： Y0914A Document type： Proceedings
Article type：原著論文 Country of issue： Japan (JPN) Language： ENGLISH (EN)

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Thermometry,thermometer , Organosilicon compounds , Physical properties in general

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