Art
J-GLOBAL ID:202002291606133990   Reference number:20A2570438

Measurement of Electron Density Fluctuations Using O-Mode Microwave Imaging Reflectometry in a TST-2 Spherical Tokamak

TST-2球状トカマクにおけるOモードマイクロ波イメージング反射計測を用いた電子密度ゆらぎ測定
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Material:
Volume: 15  Page: 2402060(J-STAGE)  Publication year: 2020 
JST Material Number: U0045A  ISSN: 1880-6821  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

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Category name(code) classified by JST.
Plasma diagnostics  ,  Fusion devices 

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