Art
J-GLOBAL ID：202102213908572839   Reference number：21A0538065

Assessing Radiation Hardness of SIC MOS Structures

SIC MOS構造の耐放射線性の評価【JST・京大機械翻訳】
Author (8)：
Moreno J.

About Moreno J.

(Alter Technology, Calle de la Majada,Tres Cantos,Spain)

About Alter Technology, Calle de la Majada,Tres Cantos,Spain

, 
Cordero E.

About Cordero E.

(Alter Technology, Calle de la Majada,Tres Cantos,Spain)

About Alter Technology, Calle de la Majada,Tres Cantos,Spain

, 
Lopez D.

About Lopez D.

(Alter Technology, Calle de la Majada,Tres Cantos,Spain)

About Alter Technology, Calle de la Majada,Tres Cantos,Spain

, 
Massetti S.

About Massetti S.

(European Space Agency (ESTEC),Noordwijk,AG,The Netherlands,2200)

About European Space Agency (ESTEC),Noordwijk,AG,The Netherlands,2200

, 
Cabello M.

About Cabello M.

(Centro Nacional de Microelectronica (CNM-CSIC), Campus UAB,Barcelona,Spain,08193)

About Centro Nacional de Microelectronica (CNM-CSIC), Campus UAB,Barcelona,Spain,08193

, 
Soler V.

About Soler V.

(Centro Nacional de Microelectronica (CNM-CSIC), Campus UAB,Barcelona,Spain,08193)

About Centro Nacional de Microelectronica (CNM-CSIC), Campus UAB,Barcelona,Spain,08193

, 
Godignon P.

About Godignon P.

(Centro Nacional de Microelectronica (CNM-CSIC), Campus UAB,Barcelona,Spain,08193)

About Centro Nacional de Microelectronica (CNM-CSIC), Campus UAB,Barcelona,Spain,08193

, 
Maset E.

About Maset E.

(University of Valencia, LEII,Burjassot,Spain,46100)

About University of Valencia, LEII,Burjassot,Spain,46100


Material：
IEEE Conference Proceedings  (IEEE Conf Proc)

About IEEE Conference Proceedings


Volume： 2018  Issue： RADECS  Page： 1-8  Publication year： 2018 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Abstract/Point：
Abstract/Point
Japanese summary of the article(about several hundred characters).
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Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
reliability (property)

About reliability (property)

, 
electric power

About electric power

, 
silicon

About silicon

, 
silicon carbide

About silicon carbide

, 
*radiation resistance (radiation effect)

About radiation resistance (radiation effect)

, 
outer space

About outer space

, 
power electronics

About power electronics

, 
output density

About output density

, 
wide band gap semiconductor

About wide band gap semiconductor


Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
動作温度

About 動作温度

, 【Automatic Indexing@JST】
JST classification (1)：
JST classification
Category name(code) classified by JST.
Graphic and image processing in general 
(JE04010I)

About Graphic and image processing in general

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
SiC

About SiC

, 
MOS構造

About MOS構造

, 
耐放射線性

About 耐放射線性

, 
評価

About 評価


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