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J-GLOBAL ID:202102218999852709   Reference number:21A0151780

RC Tightened Corner Test structure Design and Silicon Characterization in FinFET Technology

FinFET技術におけるRC強化隅角試験構造設計とシリコン特性評価【JST・京大機械翻訳】
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Material:
Volume: 2020  Issue: ICSICT  Page: 1-3  Publication year: 2020 
JST Material Number: W2441A  Document type: Proceedings
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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In this work, we propose a nov...
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Special-purpose arithmetic and control units  ,  Medical image processing  ,  Speach processing  ,  NMR in general  ,  Code theory 

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