Proj
J-GLOBAL ID:202104013323471990  Research Project code:15663670

電気抵抗率の2D/3Dマッピングと欠陥検出への応用

電気抵抗率の2D/3Dマッピングと欠陥検出への応用
National award number:JPMJTM15BB
Study period:2015 - 2016
Organization (1):
Research responsibility: ( , 化学生命工学部, 准教授 )
DOI: https://doi.org/10.52926/JPMJTM15BB
Terms in the title (5):
Terms in the title
Keywords automatically extracted from the title.
Research program:
Organization with control over the research:
Japan Science and Technology Agency

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