Proj
J-GLOBAL ID：202104015913105747  Research Project code：08150330

高性能半導体検査用接触子の開発

高性能半導体検査用接触子の開発
Study period：2009 - 2009
Organization (1)：
サンユー工業株式会社

About サンユー工業株式会社


Corporate responsibility：
サンユー工業株式会社

About サンユー工業株式会社


Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
高性能

About 高性能

, 
検査

About 検査

, 
接触子

About 接触子

, 
開発

About 開発

Research program：
Industry-Academia Collaborative R&D

About Industry-Academia Collaborative R&D

＞
R&D Programs Focused on Technology Transfer

About R&D Programs Focused on Technology Transfer

＞
Promotion for Regional Innovation

About Promotion for Regional Innovation

＞
Comprehensive Support Programs for Creation of Regional Innovation

About Comprehensive Support Programs for Creation of Regional Innovation

＞
Local Needs Rapid Response Type

About Local Needs Rapid Response Type


Organization with control over the research：
Japan Science and Technology Agency

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