Proj
J-GLOBAL ID:202104016036871499  Research Project code:7700400727

赤外光弾性法を用いた半導体及び光学単結晶の微小歪み測定検査装置

赤外光弾性法を用いた半導体及び光学単結晶の微小歪み測定検査装置
Study period:2002 -
Organization (1):
Corporate responsibility:
Research program:
Organization with control over the research:
Japan Science and Technology Agency

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