Senior Scientist
- 2023 - 2026 ナノビームX線回折による半導体デバイスの4次元断層解析
- 2016 - 2021 Multiscale characterization of singularity structures and behaviors thereof
- 2016 - 2019 Determination of composition and strain for strain released SiGe thin layers on Si with using anomalous x-ray microdiffraction
- 2014 - 2017 Development of nano-scale X-ray diffraction mapping technique
- 2013 - 2015 Characterization of InGaN films by synchrotron radiation microdiffraction with using parabolic refractive X-ray lenses made of quartz glass
- 2005 - 2010 物質科学のための放射光核共鳴散乱法の研究
- 2006 - 2009 Characterization of Si nanoelectronic materials and interface with using synchrotron radiation microprobe
- 2006 - 2007 Development and application of crystal structure analysis technology with polarized X-ray multiple wave method
- 2002 - 2003 X-ray structures of a Ag(001) surface and its Na adsorbed surface
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