Rchr
J-GLOBAL ID：200901006291837057   Update date: Jan. 30, 2024

Nakamae Kouji

ナカマエ コウジ | Nakamae Kouji
Affiliation and department：
Osaka University Graduate School of Information Science and Technology, Department of Information Systems Engineering

About Osaka University Graduate School of Information Science and Technology, Department of Information Systems Engineering


Research field  (4)： Electronic devices and equipment ,  Medical systems ,  Intelligent robotics ,  Perceptual information processing
Research keywords  (6)： 検査・診断システム ,  画像情報処理 ,  集積回路 ,  Detection and Diagnosis system ,  Image Information Processing ,  Integrated Circuit
Research theme for competitive and other funds  (18)：
  • 2012 - 2015 The differentiation between disease caused by central lesion and by peripheral lesion
  • 2010 - 2011 Estimation of prognosis by three-dimensional analysis of positional nysgatgmus in patients with benign paroxysmal positional vertigo
  • 2003 - 集団検診用X銭画像検査・診断システムに関する研究
  • 2000 - 2001 VLSIチップ観測画像からの逆設計によるその場故障診断に関する基礎的研究
  • 1998 - 2000 Fundamental study on design for testing of multi-layer structure VLSIs
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Papers (46)：
  • Takuma Okada, Yoshihiro Midoh, Koji Nakamae, Noriyuki Miura. Accurate measurement of charge density in nanoscale particles using an aperture optimization of Fourier based phase reconstruction. Proceedings of the Electronic Imaging 2022. 2022. 34. 14. 248-1
  • Takehiro Tamaoka, Yoshihiro Midoh, Kazuo Yamamoto, Shodai Aritomi, Toshiaki Tanigaki, Masao Nakamura, Koji Nakamae, Masashi Kawasaki, Yasukazu Murakami. Denoising electron holograms using the wavelet hidden Markov model for phase retrieval-Applications to the phase-shifting method. AIP Advances. 2021. 11. 2. 025135-025135
  • Endo, K., Chinone, N., Nakamura, T., Matsumoto, T., Nakamae, K. Single-pulse observation of photoemission during avalanche breakdown in insulated gate bipolar transistor. Microelectronics Reliability. 2020
  • Endo, K., Nakamae, K. Temporally- And Spatially-Resolved Observations of Current Filament Dynamics in Insulated Gate Bipolar Transistor Chip during Avalanche Breakdown. IEEE Transactions on Device and Materials Reliability. 2019. 19. 4
  • Youngji Cho, Kodai Niitsu, Yoshihiro Midoh, Koji Nakamae, Daisuke Shindo, Jun-Mo Yang, Yasukazu Murakami. Suppressing Geometric Phase Shift Owing to Antiphase Boundaries in Dark-Field Electron Holography. MATERIALS TRANSACTIONS. 2019. 60. 5. 698-703
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MISC (302)：
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Patents (4)：
  • デフォルメ地図の自動生成装置、方法、及びプログラム、並びにナビゲーション機器とサーバ
  • 強二次電子引き出し電界を持つ二次電子分光装置
  • 電子プローブ装置の高精度位置決め方法及び装置
  • 2次電子分光装置
Books (5)：
  • LSIテスティングハンドブック
    オーム社 2008
  • LSI testing handbook
    Ohmsha 2008
  • 画像処理の基礎
    昭晃堂 2002
  • 計算機システム-ハードウェアの基礎-
    昭晃堂 2000
  • Computer System : Basics of Hardware
    2000
Works (6)：
  • 超LSI故障個所解析装置ソフトウェアの開発
    2011 -
  • 超LSI故障個所解析装置ソフトウェアの開発
    2010 -
  • 超LSI故障個所解析装置
    2009 -
  • 超LSI故障個所解析装置ソフトウェアの開発
    2009 -
  • 超LSI故障個所解析装置
    2009 -
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Professional career (2)：
  • Ph.D. in Engineering (Osaka University)
  • Master of Engineering (Osaka University)
Committee career (1)：
  • 2010 - 日本信頼性学会 評議員
Association Membership(s) (10)：
日本信頼性学会 ,  THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING(SPIE) ,  IEEE(Institute of Electrical and Electronics Engineering) ,  応用物理学会 ,  電子情報通信学会 ,  The International Society for Optical Engineering ,  The Institute of Electrical and Electronics Engineers ,  The Japan Society of Applied Physics ,  Information and Communiction Engineers ,  The Institute of Electronics
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