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ArticleJ-GLOBAL ID:200902000026195685整理番号:87A0129080

Robust test generation algorithm for stuck-open fault in CMOS circuits.

CMOS回路における開路固定故障に対するロバスト検査生成アルゴリズム

著者:MAO W(Fudan Univ., Shanghai, CHN)、LING X(Fudan Univ., Shanghai, CHN)
資料名:Proc Des Autom Conf 巻:23rd ページ:236-242
発行年:1986年
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