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J-GLOBAL ID：200902000032664697   Reference number：88A0152136

A simulation-based directed-search method for test generation.

検査発生のためのシミュレーションに基づく探索法
Author (2)：
CHENG K-T

About CHENG K-T

(Univ. California, CA, USA)

About Univ. California, CA, USA

, 
AGRAWAL V D

About AGRAWAL V D

(AT&T Bell Lab., NJ, USA)

About AT&T Bell Lab., NJ, USA


Material：
Proceedings. IEEE International Conference on Computer Design: VLSI in Computers & Processors  (Proceedings. International Conference on Computer Design)

About Proceedings. IEEE International Conference on Computer Design: VLSI in Computers & Processors


Volume： 1987  Page： 48-51  Publication year： 1987 
JST Material Number： D0858B  ISSN： 1063-6404  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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All keywords is available on JDreamIII(charged).
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digital integrated circuit

About digital integrated circuit

,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

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Terms in the title (3)：
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検査

About 検査

, 
シミュレーション

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, 
探索法

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