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ArticleJ-GLOBAL ID:200902001947138136整理番号:90A0835313

Detection of all single and multiple stuck-at faults in combinational digital circuits using index vector testing.

指標ベクトル試験を用いた組み合わせディジタル回路における単一あるいは多重縮退故障の検出

著者:GUPTA I S(Indian Inst. Technology, West Bengal, IND)
資料名:Int J Syst Sci 巻:21 号:8 ページ:1489-1502
発行年:1990年08月
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