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ArticleJ-GLOBAL ID:200902015607170575整理番号:83A0456733

Erosion and transfer in electrical contacts measured using the thin layer activation technique.

薄層活性化技術を用いて測定した電気接点の腐食と移転

著者:READ P M(AERE Harwell, UK)
資料名:IEEE Trans Components Hybrids Manuf Technol 巻:6 号:2 ページ:218-221
発行年:1983年06月
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