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ArticleJ-GLOBAL ID:200902131053914542整理番号:01A0743295

Topographic cross talk in reflection mode near-field optical microscopy on patterned structures.

反射モード近接場光学顕微鏡法におけるパターン構造のトポグラフィック漏話

著者:ROSENBERGER A(RWTH‐Aachen, Aachen, DEU)、MUENNEMANN A(RWTH‐Aachen, Aachen, DEU)、KIENDL F(RWTH‐Aachen, Aachen, DEU)・・・
資料名:J Appl Phys 巻:89 号:12 ページ:7727-7729
発行年:2001年06月15日
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