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ArticleJ-GLOBAL ID:200902165133230905整理番号:00A0040210

Characterization of a Multiplexed Compton Scatter Tomograph for Non-Destructive Inspection of Thin, Low-Z Samples.

薄くて低Zの試料の非破壊検査用の多重Compton散乱トモグラフの特性評価

著者:EVANS B L(Air Force Inst. Technol., OH)、MARTIN J B(Air Force Inst. Technol., OH)、BURGGRAF L W(Air Force Inst. Technol., OH)
資料名:Conf Rec 1998 IEEE Nucl Sci Symp Vol 2 ページ:1000-1005
発行年:1999年
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