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ArticleJ-GLOBAL ID:200902212509212782整理番号:05A0677174

GaN系ショットキー接合のリーク電流

Leakage Currents in GaN-Based Schottky Interfaces

著者:橋詰保(北大 量子集積エレクトロニクス研究セ)
資料名:電子情報通信学会論文誌 C 巻:J88-C 号:8 ページ:621-629
発行年:2005年08月01日
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