Art
J-GLOBAL ID：200902076616148557   Reference number：91A0330312

Secondary charged particle spectrometer based on two-dimensional E-TOF analysis(II).

二次元E-TOF解析に基づく二次荷電粒子スペクトロメータ
Author (2)：
OGINO S

About OGINO S

(Osaka Univ.)

About Osaka Univ.

, 
TAKAHASHI A

About TAKAHASHI A

(Osaka Univ.)

About Osaka Univ.


Material：
日本原子力研究所JAERI-Mレポート

About 日本原子力研究所JAERI-Mレポート


Page： 293-301  Publication year： Mar. 1991 
JST Material Number： G0711A  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
neutron beam

About neutron beam

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=91A0330312&from=J-GLOBAL&jstjournalNo=G0711A") }}
JST classification (3)：
JST classification
Category name(code) classified by JST.
Nucleon-induced reactions and scattering 
(BG04040N)

About Nucleon-induced reactions and scattering

,  Other particle generators for elementary particle and nuclear experiments 
(BE02040T)

About Other particle generators for elementary particle and nuclear experiments

,  Radiation spectroscopy and spectrometers 
(AD08030U)

About Radiation spectroscopy and spectrometers

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
TOF

About TOF

, 
解析

About 解析

, 
荷電

About 荷電

, 
粒子スペクトロメータ

About 粒子スペクトロメータ


Return to Previous Page

TOP

BOTTOM