Art

J-GLOBAL ID：201702281357526911   Reference number：17A0512030

Electron-Induced X-Ray Intensity Ratios of Pb Lα/Lβ and As Kα/Kβ by 18-30keV Applied Voltages

18-30keV印加電圧によるPbLα/LβおよびAsKα/Kβの電子誘起X線強度比

Author (2)： DAMDINSUREN Bolortuya (Kyoto Univ., Kyoto, JPN) ,  KAWAI Jun (Kyoto Univ., Kyoto, JPN)
Material： X線分析の進歩  (X線工業分析)
Volume： 48  Page： 346-351  Publication year： Mar. 31, 2017 
JST Material Number： Z0547B  ISSN： 0911-7806  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *lead ,  *arsenic ,  *spectral line intensity ,  *elemental analysis ,  mixture ,  electron microscopy ,  Si semiconductor detector ,  voltage ,  *X-ray analysis ,  energy dispersive X-ray spectrometry
Semi thesaurus term： applied voltage ,  Microscopy, Electron, Scanning

JST classification (2)： Other phsical analysis  (CC03014E) ,  Physical analysis of elements in inorganic substances  (CC03022H)

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Terms in the title (7)： 印加電圧 ,  PBL ,  ASK ,  電子 ,  誘起 ,  X線 ,  強度比