Art
J-GLOBAL ID：201702286926847500   Reference number：17A0284338

Accurate Predictions of Defect Properties in Semiconductors: Towards Understanding, Screening, and Discovery of Materials

半導体中の欠陥特性の正確な予測:理解,スクリーニングおよび材料発見に向けて
Author (2)：
OBA Fumiyasu

About OBA Fumiyasu

(Tokyo Inst. of Technol., Yokohama, JPN)

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, 
OBA Fumiyasu

About OBA Fumiyasu

(National Inst. for Materials Sci., Tsukuba, JPN)

About National Inst. for Materials Sci., Tsukuba, JPN


Material：
AMTC Letters  (International Journal of Advanced Microscopy and Theoretical Calculations)

About AMTC Letters


Volume： 5  Page： 74-75  Publication year： May. 2016 
JST Material Number： L7013A  ISSN： 1882-9465  Document type： Proceedings
Article type： 短報  Country of issue： Japan (JPN)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
*lattice defect

About lattice defect

, 
*semiconductor

About semiconductor

, 
understanding

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, 
classification

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, 
development

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Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
material development

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JST classification (1)：
JST classification
Category name(code) classified by JST.
Lattice defects in semiconductors 
(BK12040Q)

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Terms in the title (5)：
Terms in the title
Keywords automatically extracted from the title.
欠陥

About 欠陥

, 
予測

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, 
理解

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, 
スクリーニング

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, 
発見

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