Hidenobu Mori, Haruhiko Yoshida. Temperature Dependence of Oxygen Annealing Effect on Electrical Properties of GaOx/Si Structure by Mist Chemical Vapor Deposition. 2023 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK). 2023
Hidenobu Mori, Haruhiko Yoshida. Effect of Post Deposition Annealing on Electrical Properties of GaOx/Si structure by Mist Chemical Vapor Deposition Method. 2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK). 2022
Yasushi Hotta, Ryoichi Nemoto, Keisuke Muranushi, Yujun Zhang, Hiroki Wadati, Keita Muraoka, Hiroshi Sakanaga, Haruhiko Yoshida, Koji Arafune, Hitoshi Tabata. Carrier injection behaviors from a band semiconductor to strongly correlated electron system in perovskite lanthanum vanadate/silicon junctions. Applied Physics Letters. 2022. 120. 23. 232106-232106
Hidenobu Mori, Haruhiko Yoshida. Microscopic Imaging of Inversion Layer Formation in Insulator/Semiconductor Structure by Scanning Capacitance Transient Microscopy. 2018 IEEE International Meeting for Future of Electron Devices, Kansai. 2018