Local Barrier Height imaging by Simultaneous Modulation of Tip-sample Distance and Sample Bias Voltage. 13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques. 2005. P.416
探針_試料間距離とバイス電圧を変調したSTM測定. 2005
Local Barrier Height imaging by Simultaneous Modulation of Tip-sample Distance and Sample Bias Voltage. 13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques. 2005. P.416