1) T. Yoshiike, N. Fujii and S. Kozaki, “An X-Ray Stress Measurement Method for Very Small Areas on Single Crystals”, Japanese Journal of Applid Physics, Vol.36, pp.5764-5769 (1997).
3) N. Tamura, A. A. MacDowell, R. Spolenak, B. C. Valek, J. C. Bravman, W. L. Brown, R. S. Celestre, H. A. Padmore, B. W. Batterman and J. R. Patel, “Scanning X-ray Microdiffraction with Submicrometer White Beam for Strain/Stress and Orientation Mapping in Thin Films”, Journal of Synchrotron Radiation, Vol.10, pp.137-143 (2003).
5) Y. Tomokiyo, S. Matsumura, N. Kuwano, M. Kominami, T. Okuyama and K. Oki, “Application of Higher Order Laue Zone Patterns to Lattice Parameter Determination in Cu-based Alloys”, Journal of Electron Microscopy, Vol.35, Issue 4, pp.359-364 (1986).