RUHMER, K. C4NP : New Solder Bumping Technology-Low Cost and Lead Free. IMAPS Flip Chip Advanced Technology Workshop, Austin, TX, June 2005. 2005
LONGFORD, A. Copper Pillar Bumping in Intel Microprocessors-One Approach to Lead Free. Semicon Europa 2006-Munich, Germany, April. 2006
YEOH, A. Copper Die Bumps (First Level Interconnect) and Low-K Dielectrics in 65nm High Volume Manufacturing. Proceeding of the 2005 ECTC. 2005, 1611-1615
ODEGARD, C. Dielectric Integrity Test for Flip-Chip Devices with Cu/Low-K Interconnects. Proceedings of the IEEE 2005 Electronic Components and Technology Conference. 2005, 1167