1. D. Briggs and M.P. Seah (ed.), “Practical Surface Analysis, 2nd ed., Vol. 1: Auger and X-Ray Photoelectron Spectroscopy”, 1990, John Wiley & Sons, Chichester.
2. D. Briggs and M.P. Seah (ed.), “Practical Surface Analysis, 2nd ed., Vol. 2: Ion and Neutral Spectroscopy”, 1992, John Wiley & Sons, Chichester.
3. A. Benninghoven, F.G. Rüdenauer, and H.W. Werner, “Secondary Ion Mass Spectrometry, Basic Concepts, Instrumental Aspects, Applications and Trends”, 1987, John Wiley & Sons, New York.
4. D.L. Cocke, R.K. Vempati, and R.H. Loeppert, in “Quantitative Methods in Soil Mineralogy”, ed. J.E. Amonette and L.W. Zelazny, 1994, Soil Science Society of America, Madison, 205.
5. E. Paterson and R. Swaffield, in “Clay Mineralogy; Spectroscopic and Chemical Determinative Methods”, ed. M.J. Wilson, 1994, Chapman & Hall, London, 226.