Rchr
J-GLOBAL ID:201801010541807920   Update date: Nov. 13, 2024

Ishikawa Ryo

Ishikawa Ryo
Affiliation and department:
Homepage URL  (1): http://interface.t.u-tokyo.ac.jp/japanese/index.html
Research field  (1): Nanomaterials
Research keywords  (8): Scanning Transmission Electron Microscopy ,  Nitride ,  フッ化物イオン電池 ,  貴金属ナノ触媒 ,  Complex Oxide ,  Lithium-ion Battery Materials ,  Functional Ceramics ,  Interface
Research theme for competitive and other funds  (14):
  • 2022 - 2029 3次元・ダイナミック原子分解能電子顕微鏡法の開発
  • 2024 - 2027 超収束角顕微鏡法の開発と格子欠陥材料への応用
  • 2021 - 2024 Three dimensional electric-field imaging at catalytic-interface
  • 2019 - 2024 Nanoscale Interface Characterization
  • 2020 - 2023 Catalytic degradation mechanism of noble metal nanoparticles on metal oxides
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Papers (145):
  • Kazuaki Kawahara, Ryo Ishikawa, Shun Sasano, Naoya Shibata, Yuichi Ikuhara. La1-xSrxF3-x: A Solid-State Electrolyte for Fluoride Ion Battery with High Ionic Conductivity and Wide Electrochemical Potential Window. Journal of The Electrochemical Society. 2024
  • Shun Sasano, Ryo Ishikawa, Kazuaki Kawahara, Naoya Shibata, Yuichi Ikuhara. Highly Reversible Conversion-Type CoSn2 Cathode for Fluoride-Ion Batteries. Small. 2024
  • Taichi Kusumi, Shun Katakami, Ryo Ishikawa, Kazuaki Kawahara, Tiarnan Mullarkey, Julie Marie Bekkevold, Jonathan J.P. Peters, Lewys Jones, Naoya Shibata, Masato Okada. New Poisson denoising method for pulse-count STEM imaging. Ultramicroscopy. 2024. 264. 113996-113996
  • Julie Marie Bekkevold, Jonathan J P Peters, Ryo Ishikawa, Naoya Shibata, Lewys Jones. Ultra-fast Digital DPC Yielding High Spatio-temporal Resolution for Low-Dose Phase Characterization. Microscopy and Microanalysis. 2024
  • Jiake Wei, Zhangze Xu, Wenjie Shen, Bin Feng, Ryo Ishikawa, Naoya Shibata, Yuichi Ikuhara, Xuedong Bai. Real-Space Tilting Method for Atomic Resolution STEM Imaging of Nanocrystalline Materials. Small Methods. 2024
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MISC (8):
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Lectures and oral presentations  (40):
  • 高速原子分解能STEM法の開発とその場観察への応用
    (第175回日本金属学会講演大会 2024)
  • Atomistic defect analysis by atomic-resolution electron microscopy
    (7th International Symposium on Frontiers in Materials Science 2024)
  • 点欠陥構造解析に向けた電子顕微鏡法の開発と応用
    (第6回固体化学フォーラム 2024)
  • 走査透過型電子顕微鏡法
    (第38回分析電顕討論会 2023)
  • Three dimensional imaging by STEM depth sectioning
    (2023)
more...
Professional career (1):
  • 博士(工学) (東京大学)
Work history (6):
  • 2020/04 - 現在 東京大学大学院工学系研究科 総合研究機構 特任准教授
  • 2018/10 - 2022/03 科学技術振興機構 さきがけ研究員
  • 2014/04 - 2020/03 Insitute of Engineering Innovation, University of Tokyo Assistant Professor
  • 2012/10 - 2014/03 Japan Society for the Promotion of Science
  • 2011/04 - 2012/09 東京大学大学院工学系研究科 総合研究機構 特任研究員
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Awards (7):
  • 2023/03 - 風戸研究奨励会 風戸賞 原子分解能 STEM 電子顕微鏡法による 3 次元欠陥構造解析
  • 2022/06 - 第37回論文賞顕微鏡法基礎部門 High spatiotemporal-resolution imaging in the scanning transmission electron microscope
  • 2021/04 - 文部科学省 令和3年度科学技術分野の文部科学大臣表彰 若手科学者賞
  • 2021/02 - 本多記念会 第42回本多記念研究奨励賞
  • 2018/05 - Japan Society of Microscopy Encouragement Award
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Association Membership(s) (5):
American Ceramics Society ,  Microscopy Society of America ,  THE JAPANESE SOCIETY OF MICROSCOPY ,  The Ceramic Society of Japan ,  THE JAPAN INSTITUTE OF METALS AND MATERIALS
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