Rchr
J-GLOBAL ID:201801018052844104
Update date: Jun. 28, 2024
Harada Tetsuo
ハラダ テツヲ | Harada Tetsuo
Affiliation and department:
Research field (1):
Quantum beam science
Research keywords (2):
EUV Lithography
, Soft-X-ray Optical Engineering
Research theme for competitive and other funds (7):
- 2019 - 2022 EUV Wavefront Synthesizer for Real-Time and Extended Depth-of-Focus Imaging
- 2019 - 2022 Spatial Distribution Analysis of Photo Resist Using Resonant Soft X-ray Reflectmetry and Scattering methods
- 2015 - 2018 Precise measurement of optical constants of thin films in soft X-ray region
- 2013 - 2016 Development of 1X nm EUV Resist with high sensitivity and Low LWR
- 2010 - 2012 Resist pattern replication using EUV interference lithography for 20 nm and below
- 2010 - 2011 Development of coherence diffraction imaging for high-harmonic-generation EUV source
- 2007 - 2008 Development of a new type common path interferometer for soft X-ray using a grazing angle beam splitter of a free standing membrane
Show all
Papers (136):
-
Takahiro Ueda, Marcio D. Lima, Tetsuo Harada, Takeo Watanabe, Takeshi Kondo. EUV durability of CNT pellicles for next-generation scanner. Japanese Journal of Applied Physics. 2024. 63. 3
-
Rikuya Imai, Shinji Yamakawa, Tetsuo Harada, Takeo Watanabe. Present Status of EUV Interference Lithography at NewSUBARU. Journal of Photopolymer Science and Technology. 2023. 36. 1. 53-59
-
Shinji Yamakawa, Tetsuo Harada, Koji Nakanishi, Takeo Watanabe. Characterization of Photoacid Generator Bound Resist with X-ray Absorption Spectroscopy at NewSUBARU. Journal of Photopolymer Science and Technology. 2023. 36. 1. 47-52
-
Atsunori Nakamoto, Shinji Yamakawa, Tetsuo Harada, Takeo Watanabe. Spatial Distribution Analysis of Polymers in Resist Thin Film by Reflection-mode Resonant Soft X-ray Scattering. Journal of Photopolymer Science and Technology. 2023. 36. 1. 41-45
-
Shuhei Iguchi, Tetsuo Harada, Shinji Yamakawa, Takeo Watanabe, Takeharu Motokawa. Spatial Distribution Imaging of Resist Thin Film with Micrometer Resolution using Reflection Type Soft X-ray Projection Microscope. Journal of Photopolymer Science and Technology. 2023. 36. 1. 25-30
more...
MISC (190):
-
原田哲男. Development of At-Wavelength Mask Microscopes for EUV Lithography. レーザー研究. 2024. 52. 1
-
「 コウシュツリョク タンハチョウ コウゲン カイハツ ト ソノ オウヨウ ギジュツ ノ シンテン 」 トクシュウゴウ. 2024. 52. 1. 31-35
-
渡邊健夫, 原田哲男, 山川進二. Current Status and Prospect for EUV Lithography. 応用物理学会春季学術講演会講演予稿集(CD-ROM). 2023. 70th
-
篭島靖, 上杉健太朗, 亀島敬, 高橋幸生, 武市泰男, 竹内晃久, 原田哲男, 松本浩典, 三村秀和, 矢代航. 光学界の将来ビジョン X線・極端紫外光における真の回折限界に向けて. 光学. 2022. 51. 4
-
中本敦啓, 山川進二, 原田哲男, 渡邊健夫. Resonant Soft X-Ray Scattering in Reflection-mode for Spacial Evaluation in Resist Thin Film. X線分析討論会講演要旨集. 2022. 58th
more...
Patents (4):
-
短波長コヒーレント光源及び透過型の減光機構
-
欠陥特性評価装置
-
形状測定装置
-
パタン幅測定装置
Education (3):
- 2003 - 2007 Tohoku University Graduate School of Engineering Department of Applied Physics
- 2001 - 2003 Tohoku University Graduate School of Engineering Department of Applied Physics
- 1997 - 2001 Tohoku University Faculty of Engineering
Professional career (1):
Work history (6):
Return to Previous Page