Rchr
J-GLOBAL ID:200901007155376026   Update date: Feb. 01, 2024

Hanai Takaaki

ハナイ タカアキ | Hanai Takaaki
Research field  (3): Optical engineering and photonics ,  Electronic devices and equipment ,  Applied physics - general
Research keywords  (35): 走査透過電子顕微鏡 ,  球面収差補正 ,  電子レンズ ,  薄膜レンズ ,  球面収差 ,  収差補正 ,  電子顕微鏡 ,  電子プローブ ,  量子ノイズ ,  信号演算処理 ,  最大エントロピー法 ,  分解能 ,  非回転対称収差 ,  高分解能 ,  超高分解能 ,  透過電子顕微鏡 ,  弱位相物体 ,  5次球面収差 ,  対物レンズ ,  統計ノイズ ,  複素波動関数 ,  ランダム空間分布制約条件 ,  ランダム空間分布制約 ,  プローブフォーミングレンズ ,  電子顕微鏡像 ,  球面収差測定法 ,  構造解析法 ,  陰影像 ,  コントラスト伝達関数 ,  画像修復 ,  電子顕微鏡学 ,  電子光学 ,  Image Restoration ,  Electron Microscopy ,  Electron Optics
Research theme for competitive and other funds  (12):
  • 1999 - 2000 Improvement of Resolution of a Electron Microscope by Means of Correction of Spherical Aberration Using a Foil Lens
  • 1997 - 1999 Development of electron differential interferometry and its application to magnetic materials
  • 1997 - 1998 Research on a Structure Analysis of Materials with a Maximum Entropy Restoration of Electron Microscope Images.
  • 1995 - 1996 Fundamental Study on a High Brightness and High Resolution YAG Screen for Electron Microscopy
  • 1995 - 1996 Research on an Improvement of Resolution of Electron Microscope by Means of Maximum Entropy Image Restoration.
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Papers (14):
Books (2):
  • 電気磁気学
    朝倉書店 2014 ISBN:9784254220513
  • 新インターユニバーシティ 電磁気学I
    オーム社 2013 ISBN:9784274213533
Lectures and oral presentations  (18):
  • Effect of Line Configuration on Lightning Flashover Characteristics of Electric Power Line with Insulated Covered Conductor
    (Proc. 15th Int. Symposium on High Voltage Engineering 2007)
  • Phase contrast Transfer Fuction of Spherical Aberration COrrected Objective Lens
    (Electron Microscopy 2002 2002)
  • Deconvolution and Noise Reduction in Electron Microscope Images with a Modified Maximum Entropy Method
    (Electron Microscopy 2002 2002)
  • Reduction of Spherical Aberration of a Transmission Electron Microscope by Means of a Foil Lens
    (Electron Microscopy 1998 1998)
  • Deconvolution and Noise Reduction in Electron Microscope Images with a Makimum Entropy Method Constrained by the Random Spatial Distribution of the Noise
    (Proc. Int. Symposium on Hybrid Analyses for Functional Nanostructure 1998)
more...
Education (4):
  • - 1982 Nagoya University
  • - 1982 Nagoya University Graduate School, Division of Engineering
  • - 1977 Nagoya University School of Engineering
  • - 1977 Nagoya University Faculty of Engineering
Professional career (1):
  • Doctor (Nagoya University)
Work history (4):
  • 2001/04 - 現在 Suzuka National Institute of Technology Department of Electric and Elecronic Technology Professor
  • 1998/04 - 2000/03 Nagoya University Graduate School of Engineering Associate Professor
  • 1982/04 - 1989/04 Nagoya University Faculty of Engineering Assistant Professor
  • 1982 - 1989 Nagoya University, Research Assistant1989-2001 Nagoya University, Assistant Professor2001- Suzuka National College of Technology, Professor
Committee career (1):
  • 1990 - 1996 日本学術振興会マイクロビームアナリシス第141委員会 運営委員
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