Rchr
J-GLOBAL ID：200901028333897423
Update date: Aug. 21, 2022
Yamazaki Takashi
ヤマザキ タカシ | Yamazaki Takashi
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Research field (1)：
Semiconductors, optical and atomic physics
Research keywords (4)：
TEM
, HAADF STEM
, TEM
, HAADF STEM
Research theme for competitive and other funds (2)：
1999 - 2007 HAADF STEM法を用いた構造解析
1999 - 2007 Structural analysis using HAADF STEM method
MISC (30)：
Takashi Yamazaki, Kazuto Watanabe, Koji Kuramochi, Iwao Hashimoto. Extended dynamical HAADF STEM image simulation using the Bloch-wave method. ACTA CRYSTALLOGRAPHICA SECTION A. 2006. 62. 4. 233-236
T Yamazaki, T Isaka, K Kuramochi, Hashimoto, I, K Watanabe. Precise measurement of local strain fields with energy-unfiltered convergent-beam electron diffraction. ACTA CRYSTALLOGRAPHICA SECTION A. 2006. 62. 3. 201-207
N Nakanishi, K Kusakabe, T Yamazaki, K Ohkawa, Hashimoto, I. In concentration and tilt of the a-plane (11(2)over-bar-0) InGaN/GaN film by TEM analysis. PHYSICA B-CONDENSED MATTER. 2006. 376. 527-531
N Nakanishi, Y Kotaka, T Yamazaki. An expanded approach to noise reduction from high-resolution STEM images based on the maximum entropy method. ULTRAMICROSCOPY. 2006. 106. 3. 233-239
T Yamazaki, Y Kotaka, Y Kikuchi, K Watanabe. Precise measurement of third-order spherical aberration using low-order zone-axis Ronchigrams. ULTRAMICROSCOPY. 2006. 106. 3. 153-163
ｍore...
Education (6)：
- 2004 Tokyo University of Science Graduate School of Science
- 2004 Tokyo University of Science Graduate School, Division of Natural Science
- 2001 Tokyo University of Science Graduate School of Science
- 2001 Tokyo University of Science Graduate School, Division of Natural Science Physics
- 1999 Tokyo University of Science
- 1999 Tokyo University of Science Faculty of Science Physics
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Professional career (1)：
PhD (Tokyo University of Science)
Work history (1)：
2004 - - 東京理科大学理学部第一部物理学科 助手
Awards (2)：
2005 - MSA Poster Award. Advances in Instrumentation and Techniques (1st Prize) in Microscopy & Microanalysis 2005
2000 - Best Poster Award in 8th Conference on Frontiers of Electron Microscopy in Materials Science
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