A Study on Method of Semiconductor Material Measurement Supported by Accurate FDTD EM-field Simulation in Millimeter-wave Range
(2007 Int. Meeting for Future of Electron Devices, Kansai 2007)
A Study on Method of Semiconductor Material Measurement Supported by Accurate FDTD EM-field Simulation in Millimeter-wave Range
(2007 Int. Meeting for Future of Electron Devices, Kansai 2007)
Ferroelectric Characteristic of Group IV Elements added SrBi2Ta2O7 Thin Films
(14th Workshop on Dielectrics in Microelectronics 2006)
Ferroelectric Characteristic of Group IV Elements added SrBi2Ta2O7 Thin Films
(14th Workshop on Dielectrics in Microelectronics 2006)