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J-GLOBAL ID:200901061711205630   Update date: Aug. 30, 2020

YASUMASA TANISHIRO

タニシロ ヤスマサ | YASUMASA TANISHIRO
Affiliation and department:
Job title: Assistant Professor
Research field  (3): Thin-film surfaces and interfaces ,  Applied materials ,  Semiconductors, optical and atomic physics
Research theme for competitive and other funds  (10):
  • 2004 - Development of 0.05nm resolution aberration corrected TEM/STEM.
  • 2004 - 0.05nm分解能・透過-走査透過型・収差補正電子顕微鏡の開発
  • 2001 - Mechanical and electronic properties, and the structure of nanowire studied by TEM-AFM
  • 2001 - 超高真空高分解能透過電子顕微鏡-AFM法によるナノワイヤの原子構造、力、コンダクタンスの研究
  • Surface Structure Analysis by Transmission Electron Diffraction
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MISC (231):
Books (56):
  • 表面物性工学ハンドブック 第2版
    丸善 2007
  • Spectro-microscopy by TEM-SEM
    Lecture Note in Physics: Nanoscale Spectroscopy and Its Applications to Semiconductor Research 2002
  • Spectro-microscopy by TEM-SEM
    Lecture Note in Physics: Nanoscale Spectroscopy and Its Applications to Semiconductor Research 2002
  • 表面物性測定
    丸善 実験物理学講座 2001
  • Energy Filtering in UHV Reflection Electron Microscopy
    Microbeam Analysis 2000 (Proc. 2nd Conf. of International Union of Microbeam Analysis Societies, Kailua-Kona, Hawaii, 2000, Eds. D.B.Wiliams and R.Shimizu) IOP Conf. Series 2000
more...
Lectures and oral presentations  (32):
  • Observation of Deformation and Rupture Process of Gold Nanowire Under the Stress
    (Physical Society of Japan 2006)
  • Study of Structure and Electric Conduction of Silver Nanowires Using TEM-STM
    (Physical Society of Japan 2006)
  • Observation of Structure and Conductance Measurement of Silver Nanowires Using TEM-STM III
    (Physical Society of Japan 2006)
  • Structure Change of Au Nanowire Caused by Stress Change
    (Physical Society of Japan 2006)
  • Development of Image Recording System for In-situ High-resolution TEM Observation: Lens-coupling Electron Multiplier CCD (EM-CCD) System
    (The 16th International Microscopy Congress 2006)
more...
Education (3):
  • - 1980 Tokyo Institute of Technology
  • - 1980 Tokyo Institute of Technology
  • - 1978 Tokyo Institute of Technology Dept. of Physics
Professional career (1):
  • Master of Science
Work history (8):
  • 1998 - 2007 :Tokyo Institute of Technology Graduate School of Science and Engineering Assistant Professor
  • 1998 - 2007 :東京工業大学 大学院理工学研究科 助手
  • 2007 - -:Tokyo Institute of Technology Graduate School of Science and Engineering Assistant Professor
  • 2007 - -:東京工業大学 大学院理工学研究科 助教
  • 1986 - 1998 :Tokyo Institute of Technology Faculty of Science Assistant Professor
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Committee career (6):
  • 2007 - 2007 日本結晶学会 平成19年度年会実行委員
  • 2007 - 2007 日本結晶学会 平成19年度年会 実行委員
  • 2003 - 2005 日本顕微鏡学会 関東支部幹事
  • 2003 - 2005 日本顕微鏡学会 超分解能電子顕微鏡分科会 責任者、関東支部幹事、関東支部幹事 、関東支部評議員
  • 1992 - 1993 日本物理学会 表面界面分科世話人
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Awards (8):
  • 2004 - SSSJ Paper Award, The Surface Science Society of Japan
  • 2004 - 日本表面科学会論文賞
  • 2001 - Seto Award, Japanese Society of Electron Microscopy
  • 2001 - 日本電子顕微鏡学会学会賞(瀬藤賞)
  • 1990 - Tejima Award (Nakamura Prize), Tejima Organization
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Association Membership(s) (10):
The Physical Society of Japan ,  The Crystallographic Society of Japan ,  American Physical Society ,  The Japanese Society of Microscopy ,  The Surface Science Society of Japan ,  日本物理学会 ,  日本結晶学会 ,  アメリカ物理学会 ,  日本顕微鏡学会 ,  日本表面科学会
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