Rchr
J-GLOBAL ID:200901084323846593   Update date: Jul. 17, 2024

Hijikata Yasuto

ヒジカタ ヤスト | Hijikata Yasuto
Research field  (5): Electronic devices and equipment ,  Electric/electronic material engineering ,  Optical engineering and photonics ,  Crystal engineering ,  Applied materials
Research theme for competitive and other funds  (13):
  • 2022 - 2025 Generation of arbitrary polarized single-photons by injection of spin electric current to a silicon carbide MOS device
  • 2021 - 2024 Elucidation of SiC-MOS interfaces by developing electronic structure calculation methods
  • 2018 - 2021 Multi-scale calculations for complex correlation appearing in SiC oxidation and its impact on electronic properties
  • 2017 - 2020 Quantum state measurements of single photon sources in silicon carbide devices
  • 2015 - 2019 Development of an extreme environment resistive CCD using silicon carbide
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Papers (111):
  • Yasuto Hijikata, Shota Komori, Shunsuke Otojima, Yu-Ichiro Matsushita, Takeshi Ohshima. Impact of formation process on the radiation properties of single-photon sources generated on SiC crystal surfaces. Applied Physics Letters. 2021. 118. 20
  • Takuma Narahara, Shin-Ichiro Sato, Kazutoshi Kojima, Yasuto Hijikata, Takeshi Ohshima. Influences of hydrogen ion irradiation on NcVsi- formation in 4H-silicon carbide. Applied Physics Express. 2021. 14. 2
  • Yuichi Yamazaki, Yoji Chiba, Shin-Ichiro Sato, Takahiro Makino, Naoto Yamada, Takahiro Satoh, Kazutoshi Kojima, Yasuto Hijikata, Hidekazu Tsuchida, Norihiro Hoshino, et al. Carrier dynamics of silicon vacancies of SiC under simultaneous optically and electrically excitations. Applied Physics Letters. 2021. 118. 2
  • Shin-Ichiro Sato, Takuma Narahara, Shinobu Onoda, Yuichi Yamazaki, Yasuto Hijikata, Brant C. Gibson, Andrew D. Greentree, Takeshi Ohshima. Near infrared photoluminescence of ncvsi-centers in high-purity semi-insulating 4h-sic irradiated with energetic charged particles. Materials Science Forum. 2020. 1004. 355-360
  • Yoji Chiba, Yuichi Yamazaki, Shin-Ichiro Sato, Takahiro Makino, Naoto Yamada, Takahiro Satoh, Yasuto Hijikata, Takeshi Ohshima. Enhancement of ODMR contrasts of silicon vacancy in SiC by thermal treatment. Materials Science Forum. 2020. 1004. 337-342
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MISC (23):
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Books (1):
  • テラヘルツ反射分光法による炭化珪素半導体の電気的特性の非破壊マッピング測定
    [土方泰斗] 2007
Education (1):
  • 1996 - 1999 Tokyo Institute of Technology Interdisciplinary Graduate School of Science and Engineering
Work history (3):
  • 2006/04 - 現在 Saitama University Graduate School of Science and Engineering Associate Professor
  • 2005/09 - 2006/03 CNR IMM Guest Researcher
  • 1999/10 - 2006/03 Saitama University Faculty of Engineering Assistant Professor
Committee career (2):
  • 2019/01 - 現在 Japan Society of Applied Physics Representative
  • 2010/04 - 現在 Japan Society of Applied Physics, Advanced Power Semiconductors Division Member
Awards (1):
  • 2019/03 - Japan Society of Applied Physics 13th Poster Award Structural Identification of the Single-Photon Sources Formed on SiC Surface using Isotope Oxygen
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