Rchr
J-GLOBAL ID:200901096574214055   Update date: Dec. 12, 2023

KOBAYASHI Daisuke

コバヤシ ダイスケ | KOBAYASHI Daisuke
Affiliation and department:
Job title: Associate Professor
Research field  (1): Electronic devices and equipment
Research keywords  (11): Computers can be surprised ,  Computers can be tired ,  Space electronics engineering ,  Space-chip engineering ,  Extreme-environment IoT ,  Soft errors ,  Cosmic-ray ,  Radiation ,  Reliability ,  VLSI ,  センサ・半導体デバイス
Research theme for competitive and other funds  (8):
  • 2023 - 2026 TBD
  • 2020 - 2023 高信頼性LSIの開発コスト削減に向けたソフトエラー耐性スクリーニングの実現
  • 2014 - 2017 XPS Study on ultra thin SiO$_2$ film formed on Si substrates with several surface orientations
  • 2012 - 2015 Radiation-induced increase in local temperature and its effects on soft error tolerance
  • 2009 - 2011 Study on dielectric constant of ultrathin SiO$_2$ by using XPS and first-principles calculation
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Papers (46):
  • Lists only peer-reviewed journal publications. 2222
  • Daisuke Kobayashi, Masashi Uematsu, Kazuyuki Hirose. Threshold and Characteristic LETs in SRAM SEU Cross-Section Curves. IEEE Transactions on Nuclear Science. 2023. 70. 4. 707-713
  • Daisuke Kobayashi, Kazuyuki Hirose, Keita Sakamoto, Yuta Tsuchiya, Shogo Okamoto, Shunsuke Baba, Hiroyuki Shindou, Osamu Kawasaki, Takahiro Makino, Takeshi Ohshima. An SRAM SEU Cross Section Curve Physics Model. IEEE Transactions on Nuclear Science. 2022. 68. 3. 232-240
  • Keita Sakamoto, Masaki Kusano, Takanori Narita, Shigeru Ishii, Kazuyuki Hirose, Shunsuke Baba, Daisuke Kobayashi, Shogo Okamoto, Hiroyuki Shindou, Osamu Kawasaki, et al. Investigation of buried-well potential perturbation effects on SEU in SOI DICE-based flip-flop under proton irradiation. IEEE Transactions on Nuclear Science. 2021. 68. 6. 1222-1227
  • Daisuke Kobayashi. Scaling trends of digital single-event effects: A survey of SEU and SET parameters and comparison with transistor performance. IEEE Transactions on Nuclear Science. 2021. 68. 2. 124-148
more...
MISC (5):
Patents (5):
  • 半導体装置及び半導体演算装置
  • 半導体装置
  • 磁気抵抗メモリ素子及び磁気抵抗メモリ回路
  • 半導体装置
  • 半導体メモリの放射線耐性補償装置及びその方法並びに電子回路
Books (3):
  • Predicting, Characterizing, and Mitigating SEE in Advanced Semiconductor Technologies (IEEE NSREC Short Course Notebook)
    2019
  • 電気特性の測定、評価とデータ解釈
    技術情報協会 2015
  • ナノエレクロノニクスにおける絶縁超薄膜技術-成膜技術と膜・界面の物性科学
    株式会社エヌ・ティー・エス 2012
Lectures and oral presentations  (65):
  • Listed only refereed international conference presentations
    (2222)
  • How harsh is space?-Equations that connect space and ground VLSI
    (Symposium on VLSI Technology and Circuits)
  • Soft- and hard-error radiation reliability of 228 kB 3T+1C oxide semiconductor memory
    (IEEE International Reliability Physics Symposium (IRPS))
  • Evaluation of X-ray resistance of submicron-size c-axis aligned crystalline oxide semiconductor
    (SID International Display Week Symposium and Seminar)
  • Design and heavy-ion testing of MTJ/CMOS hybrid LSIs for space-grade soft-error reliability
    (IEEE International Reliability Physics Symposium (IRPS))
more...
Education (2):
  • 2000 - 2005 The University of Tokyo Graduate School of Frontier Sciences, Department of Frontier Informatics
  • 1996 - 2000 The University of Tokyo The Faculty of Engineering, Department of Electronics Engineering
Professional career (1):
  • D.S. (The University of Tokyo)
Work history (8):
  • 2023/04 - 現在 Graduate School of Engineering, The University of Tokyo Department of Electrical Engineering and Information Systems (EEIS) Associate Professor
  • 2019/11 - 現在 Japan Aerospace Exploration Agency Institute of Space and Astronautical Science, Department of Spacecraft Engineering Associate Professor
  • 2017/07 - 現在 Japan Aerospace Exploration Agency Research and Development Directorate, Research Unit I
  • 2020/03 - 2023/03 The Graduate University for Advanced Studies School of Physical Sciences Associate Professor
  • 2011/04 - 2019/12 Graduate School of Engineering, The University of Tokyo Department of Electrical Engineering and Information Systems (EEIS) Assistant Professor
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Committee career (1):
  • 2013 - 2020/03 S&T Experts Network Member Member
Awards (8):
  • 2022 - IEEE Nuclear and Space Radiation Effects Conference Outstanding Conference Paper Award An SRAM SEU Cross Section Curve Physics Model
  • 2019 - IEEE Nuclear and Space Radiation Effects Conference Committee IEEE Nuclear and Space Radiation Effects Conference Award Basics of single event effect mechanisms and predictions
  • 2018 - The Japan Society of Applied Physics, Silicon Technology Division JSAP Silicon Technology Division Paper Award Heavy-ion soft-errors in back-biased thin-BOX SOI SRAMs: Hundredfold sensitivity due to line-type multi-cell upset
  • 2015 - Japan Aerospace Exploration Agency, Institute of Space and Astronautical Science ISAS Director-General Award Development of the Micro Deep-space Explorer "PROCYON"
  • 2011 - Society for Promotion of Space Science Space Science Award for Young Scientists Understanding and Modeling of Radiation-Induced Pulse Noises Disturbing Spacecraft LSI Operations
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Association Membership(s) (5):
IEEE Electron Devices Society ,  Japan Society of Applied Physics ,  IEEE Nuclear and Plasma Sciences Society ,  IEEE Solid-State Circuits Society ,  Institute of Electronics, Information and Communication Engineers
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