Art
J-GLOBAL ID:200902015674126424
Reference number:92A0432254
Electric Field Dependence of Hole Transit Time in TOF Experiments in a-Si:H.
a-Si:HのTOFの正孔飛行時間の電場依存性
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Author (5):
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Material:
Volume:
39th
Issue:
Pt 2
Page:
757
Publication year:
Mar. 1992
JST Material Number:
Y0054A
Document type:
Proceedings
Country of issue:
Japan (JPN)
Language:
JAPANESE (JA)
Terms in the title (5):
Terms in the title
Keywords automatically extracted from the title.
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