Atomic force microscope-Force mapping and profiling on a sub 100-Å scale.

MARTIN Y; WILLIAMS C C; WICKRAMASINGHE H K

Art

J-GLOBAL ID：200902020466609156 Reference number：87A0481663

Atomic force microscope-Force mapping and profiling on a sub 100-Å scale.

原子間力検知型顕微鏡試料表面の100Å以下のスケールでの力のマッピングとプロフィル

Publisher site Copy service {{ this.onShowCLink("http://jdream3.com/copy/?sid=JGLOBAL&noSystem=1&documentNoArray=87A0481663&COPY=1") }}
Access JDreamⅢ for advanced search and analysis. {{ this.onShowJLink("http://jdream3.com/lp/jglobal/index.html?docNo=87A0481663&from=J-GLOBAL&jstjournalNo=C0266A") }}

Author (3)： , ,
Material：
Volume： 61 Issue： 10 Page： 4723-4729 Publication year： May. 15, 1987
JST Material Number： C0266A ISSN： 0021-8979 CODEN： JAPIAU Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

,...
,...

To see more with JDream III (charged). {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=87A0481663&from=J-GLOBAL&jstjournalNo=C0266A") }}

Microscopy determination of structures , Surface structure of solids in general

, , , , , ,

Return to Previous Page