Art
J-GLOBAL ID：200902022206261981   Reference number：89A0506531

Scanning force microscopy using a simple low-noise interferometer.

簡単な低ノイズ干渉計を用いた走査型力顕微鏡
Author (1)：
DEN BOEF A J

About DEN BOEF A J

(Philips Research Lab., Eindhoven, NLD)

About Philips Research Lab., Eindhoven, NLD


Material：
Applied Physics Letters  (Appl Phys Lett)

About Applied Physics Letters


Volume： 55  Issue： 5  Page： 439-441  Publication year： Jul. 31, 1989 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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microscope

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,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Electron and ion microscopes 
(BD02050B)

About Electron and ion microscopes

,  Microscopy determination of structures 
(BK01040E)

About Microscopy determination of structures

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
低ノイズ

About 低ノイズ

, 
干渉計

About 干渉計

, 
走査型力顕微鏡

About 走査型力顕微鏡


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