Art
J-GLOBAL ID：200902026510924518   Reference number：88A0544938

Novel optical approach to atomic force microscopy.

原子間力顕微鏡法への新しい光学的研究法
Author (2)：
MEYER G

About MEYER G

(IBM Thomas J. Watson Research Center, NY, USA)

About IBM Thomas J. Watson Research Center, NY, USA

, 
AMER N M

About AMER N M

(IBM Thomas J. Watson Research Center, NY, USA)

About IBM Thomas J. Watson Research Center, NY, USA


Material：
Applied Physics Letters  (Appl Phys Lett)

About Applied Physics Letters


Volume： 53  Issue： 12  Page： 1045-1047  Publication year： Sep. 19, 1988 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
microscope

About microscope

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=88A0544938&from=J-GLOBAL&jstjournalNo=H0613A") }}
JST classification (1)：
JST classification
Category name(code) classified by JST.
Electron and ion microscopes 
(BD02050B)

About Electron and ion microscopes

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
原子間力顕微鏡法

About 原子間力顕微鏡法

, 
光学

About 光学

, 
研究

About 研究


Return to Previous Page

TOP

BOTTOM