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J-GLOBAL ID:200902026785484143   Reference number:85A0191363

Surface profile measurement with a scanning differential ac interferometer.

走査差動ac干渉計による表面形状測定
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Volume: 23  Issue: 24  Page: 4544-4553  Publication year: Dec. 15, 1984 
JST Material Number: B0026B  ISSN: 1559-128X  CODEN: APOPAI  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Interferometry and interferometers 
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