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J-GLOBAL ID:200902038385184203   Reference number:91A0854460

Effects of dc bias on the kinetics and electrical properties of silicon dioxide grown in an electron cyclotron resonance plasma.

電子サイクロトロン共鳴プラズマ中で成長させた二酸化けい素のカイネティクスと電気的特性に及ぼすdcバイアスの効果
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Material:
Volume: 70  Issue:Page: 3301-3313  Publication year: Sep. 15, 1991 
JST Material Number: C0266A  ISSN: 0021-8979  CODEN: JAPIAU  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Oxide thin films  ,  金属-絶縁体-半導体構造【’81~’92】 

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