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J-GLOBAL ID:200902049541547526   Reference number:92A0229069

Heteroepitaxial growth of conductive and insulating films on semiconductor substrates.

導電性・絶縁性材料と半導体とのヘテロエピタキシャル成長
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Volume: 61  Issue:Page: 104-116  Publication year: Feb. 1992 
JST Material Number: F0252A  ISSN: 0369-8009  CODEN: OYBSA  Document type: Article
Article type: 文献レビュー  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Metallic thin films  ,  Oxide thin films  ,  半導体-金属接触【’81~’92】  ,  Materials of solid-state devices 
Reference (134):
  • TUNG, R. T. Silicon Molecular Beam Epitaxy. 1988, 2, 13
  • TUNG, R. T. Atomic Level Properties of Interface Materials
  • PHILLIPS, J. M. Silicon Molecular Beam Epitaxy. 1988, 1, 135
  • 古川静二郎. SOI構造形成技術. 1987
  • FURUKAWA, S. Proc. Int. Conf. Solid State Devices, Tokyo, 1982. Jpn. J. Appl. Phys. 1983, 22 Suppl. 22-1, 21
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