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J-GLOBAL ID:200902063944612622   Reference number:90A0655218

Determination of interface trap capture cross sections using three-level charge pumping.

3準位電荷ポンピングによる界面トラップ捕獲断面積の求め方
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Volume: 11  Issue:Page: 339-341  Publication year: Aug. 1990 
JST Material Number: B0344B  ISSN: 0741-3106  CODEN: EDLEDZ  Document type: Article
Article type: 短報  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Transistors 
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