Art
J-GLOBAL ID：200902074131900770   Reference number：91A0342201

A new procedure for weighted random built-in self-test.

重みづけされたランダムBISTのための新しい過程
Author (3)：
MURADALI F

About MURADALI F

(McGill Univ., Qu<span style=text-decoration:overline>e ́</span>bec, CAN)

About McGill Univ., Qu<span style=text-decoration:overline>e ́</span>bec, CAN

, 
AGARWAL V K

About AGARWAL V K

(McGill Univ., Qu<span style=text-decoration:overline>e ́</span>bec, CAN)

About McGill Univ., Qu<span style=text-decoration:overline>e ́</span>bec, CAN

, 
NADEAU-DOSTIE B

About NADEAU-DOSTIE B

(Bell-Northern Reserach (Corkstown), Ontario, CAN)

About Bell-Northern Reserach (Corkstown), Ontario, CAN


Material：
Proceedings. International Test Conference  (Proc Int Test Conf)

About Proceedings. International Test Conference


Volume： 1990  Page： 660-669  Publication year： 1990 
JST Material Number： E0211B  ISSN： 1089-3539  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
circuit test

About circuit test

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=91A0342201&from=J-GLOBAL&jstjournalNo=E0211B") }}
JST classification (1)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
重みづけ

About 重みづけ

, 
BIST

About BIST

, 
過程

About 過程


Return to Previous Page

TOP

BOTTOM