Art
J-GLOBAL ID：200902078158721601   Reference number：92A0434212

Combined shear force and near-field scanning optical microscopy.

せん断力と近視野走査を組合せた光学顕微鏡観察
Author (3)：
BETZIG E

About BETZIG E

(AT&T Bell Lab., New Jersey)

About AT&T Bell Lab., New Jersey

, 
FINN P L

About FINN P L

(AT&T Bell Lab., New Jersey)

About AT&T Bell Lab., New Jersey

, 
WEINER J S

About WEINER J S

(AT&T Bell Lab., New Jersey)

About AT&T Bell Lab., New Jersey


Material：
Applied Physics Letters  (Appl Phys Lett)

About Applied Physics Letters


Volume： 60  Issue： 20  Page： 2484-2486  Publication year： May. 18, 1992 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
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optical microscopy

About optical microscopy

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
near field(optics)

About near field(optics)


   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=92A0434212&from=J-GLOBAL&jstjournalNo=H0613A") }}
JST classification (1)：
JST classification
Category name(code) classified by JST.
Optical microscopes,telescopes 
(QF05050R)

About Optical microscopes,telescopes

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
せん断力

About せん断力

, 
近視野

About 近視野

, 
走査

About 走査

, 
光学顕微鏡観察

About 光学顕微鏡観察


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