Art
J-GLOBAL ID:200902085016653680   Reference number:90A0605555

A fast, preparation-free method to detect iron in silicon.

Si中のFeを検出する迅速で検査用試料作製の必要がない方法
Author (2):
Material:
Volume: 67  Issue: 11  Page: 6764-6771  Publication year: Jun. 01, 1990 
JST Material Number: C0266A  ISSN: 0021-8979  CODEN: JAPIAU  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=90A0605555&from=J-GLOBAL&jstjournalNo=C0266A") }}
JST classification (2):
JST classification
Category name(code) classified by JST.
Lattice defects in semiconductors  ,  Other phsical analysis 
Terms in the title (4):
Terms in the title
Keywords automatically extracted from the title.

Return to Previous Page