In situ x-ray diffraction measurement of Pd<sub>2</sub>Si transformation kinetics using a linear position-sensitive detector.

LITTLE T W; CHEN H

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J-GLOBAL ID：200902085692935257 Reference number：88A0536353

In situ x-ray diffraction measurement of Pd₂Si transformation kinetics using a linear position-sensitive detector.

一次元位置鋭敏検出器を用いたPd₂Si形成の動力学のX線回折によるその場測定

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Volume： 63 Issue： 4 Page： 1182-1190 Publication year： Feb. 15, 1988
JST Material Number： C0266A ISSN： 0021-8979 CODEN： JAPIAU Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Thin films of other inorganic compounds , X-ray diffraction methods

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In situ x-ray diffraction measurement of Pd2Si transformation kinetics using a linear position-sensitive detector.

In situ x-ray diffraction measurement of Pd₂Si transformation kinetics using a linear position-sensitive detector.