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J-GLOBAL ID：200902088977103076   Reference number：83A0194681

Automated visual inspection: A survey.

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Author (2)：
CHIN R T

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(Univ. Wisconsin)

About Univ. Wisconsin

, 
HARLOW C A

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(Louisiana State Univ.)

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Material：
IEEE Transactions on Pattern Analysis and Machine Intelligence  (IEEE Transactions on Pattern Analysis & Machine Intelligence)

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Volume： 4  Issue： 6  Page： 557-573  Publication year： Nov. 1982 
JST Material Number： B0519B  ISSN： 0162-8828  CODEN： ITPIDJ  Document type： Article
Article type： 文献レビュー  Country of issue： United States (USA)  Language： ENGLISH (EN)
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computer vision

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,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
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Pattern recognition 
(JE07000S)

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,  図形・画像処理【’81~’92】 
(JE04000X)

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文献展望

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