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J-GLOBAL ID：200902093450278130
Reference number：91A0357393
QUIETEST: A quiescent current testing methodology for detecting leakage faults.
QUIETEST 漏れ故障検出のための静かな電流試験方法
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Author (4)：
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Material：
Volume：
1990
Page：
280-283
Publication year：
1990
JST Material Number：
D0968C
ISSN：
1092-3152
Document type：
Proceedings
Article type：
原著論文
Country of issue：
United States (USA)
Language：
ENGLISH (EN)
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Semiconductor integrated circuit
Terms in the title (3)：
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